The October issue of Microwave Journal features an article by our CEO/CTO, Dr. Ali Fard, as its Cover Feature.
The article, “Wi-Fi 8 Without Digital Pre-Distortion: Linear-by-Design CMOS-SOI RF Front-Ends for the Ultra-High Reliability Era,” looks at what Wi-Fi 8 (IEEE 802.11bn) demands of the RF front-end (RFFE).
Wi-Fi 8 is the first generation in three decades focused on reliability rather than higher peak speeds, and that puts the spotlight on how RFFEs perform in real-world conditions, such as 3:1 VSWR.
Inside the article:
🔹The Reliability Pivot
🔹What 4096 QAM Really Asks of a PA
🔹Three Decades of Silicon Falling Short
🔹The Digital Pre-Distortion Tax
🔹Where Reliability Actually Dies: The VSWR Problem
🔹Linear by Design: An Architectural Answer
🔹Measured Results
🔹Architecture Versus Material
🔹The Road to Wi-Fi 8
Read the full article in Microwave Journal.
